As a tube-above sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, the Rigaku ZSX PrimusIV delivers rapid quantitative determination of major and minor atomi...
The ZSX Primus IVi WDXRF spectrometer incorporates a 30 micron Be tube window, the narrowest standard tube window in the industry, providing great light
Fast, precise elemental analysis of beryllium (Be) through uranium (U) The Rigaku ZSX® Primus 400 sequential wavelength dispersive X-ray fluorescence spectrometer provides unequaled flexibility,
Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus IV𝒾 WDXRF spectrometer features a 30 micron Be tube window, the thinnest standard tube
Affordable, high-end, tube-above Industrial WDXRF for the analysis of solid samples. High-power, tube-below, sequential WDXRF spectrometer with new ZSX
The ZSX Primus IV XRF spectrometer is a high power (4kW) sequential WDXRF instrument that combines high-throughput with industry-leading light element
ZSX Primus IV𝒾 High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software Learn more
This new scanning wavelength dispersive X-ray fluorescence spectrometer features Rigaku''s unique X-ray tube-above configuration and is built upon the succesful
The Rigaku (USA) ZSX Primus II wavelength dispersive X-ray fluorescence spectrometer is the newest member of the ZSX family of spectrometers.
ZSX Primus 400 Sequential wavelength dispersive X-ray fluorescence spectrometer
ZSX Primus II Wave length Dispersive X-Ray Fluorescence Spectrometer XRF is used to determine chemical composition of all kinds of materials. The materials
The ZSX Primus IV is Rigaku''s newest and most powerful XRF spectrometer. As a wavelength dispersive sequential spectrometer, the Primus IV boasts rapid
Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX PrimusIV WDXRF spectrometer features a 30 micron tube, the thinnest end-window tube available in
ZSX Primus400 Sequential Wavelength Dispersive XRF Spectrometer for Large Samples Elemental analysis of solids, liquids, powders, alloys and thin films
SUPPORTING ANALYSIS USING ZSX GUIDANCE • Facilitates comprehensive analysis with automatic settings and smart selection features for quantitative applications with minimal operator intervention.
ZSX Primus IV features TUBE-ABOVE EXCITATION SAFELY HANDLES POWDER SAMPLES ged by falling sample particles. Enhanced sensitivity and improved accuracy in the analysis of powder
Reliability Rigaku XRF spectrometers are the most reliable in the world. The ZSX Primus and ZSX Primus II spectrometers include automatic pressure control and a dual pump vacuum system. Our
The ZSX Primus IV from Rigaku is a high-performance wavelength dispersive X-ray fluorescence (WDXRF) spectrometer. The tube-above sequential WDXRF
ZSX Primus IV𝒾 Tube-below sequential wavelength dispersive X-ray fluorescence spectrometer Sequential wavelength dispersive X-ray fluorescence spectrometer
Find ZSX Primus IVi and related products in the theme worlds Topic World Spectroscopy Investigation with spectroscopy gives us unique insights into the
ZSX Primus III NEXT Tube-above sequential wavelength dispersive X-ray fluorescence spectrometer for industrial applications Elemental analysis of solid
The ZSX Primus Series of wavelength dispersive X-Ray fluorescence spectrometers from Rigaku continues the tradition of delivering accurate results in both a timely and seamless manner, with
SPECTROMETER PARAMETERS IN RESULTS VIEW Analytical results may depend strongly on the status of the X-ray spectrometer''s physical parameters: vacuum, temperature and detector gas flow
Tube-above sequential WDXRF spectrometer for industrial applications This WDXRF spectrometer for industrial applications is ideal for elemental analysis of solid
The Rigaku ZSX Primus IVi offers high-speed chemical analysis of geological materials, liquids, alloys, chemicals and plated metals. As a sequential WDXRF
Rigaku''s ZSX Primus III NEXT delivers rapid quantitative determination of major and minor atomic elements (down to ppm levels), from Be through Cm, for solid
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